PhET Semiconductor / Circuit Construction Kit, Tinkercad Circuits, or Falstad Circuit Simulator — free and browser-based.
A modern browser such as Chrome, Firefox, or Edge with JavaScript enabled.
Excel, Google Sheets, or LibreOffice Calc for recording readings and plotting the V-I graph.
Silicon PN junction diode (e.g. 1N4007) and a microammeter (or a milliammeter capable of resolving microamp-range readings in the simulator).
In reverse bias, the positive terminal of the source is connected to the n-side and the negative terminal to the p-side of the diode. This widens the depletion region and prevents majority carriers from crossing the junction. However, a very small current still flows due to the drift of minority carriers — this is called the reverse saturation current (I₀).
If the reverse voltage is increased beyond the diode's rated breakdown voltage, the current rises sharply (avalanche or Zener breakdown). This experiment stays within the safe reverse voltage range and does not reach breakdown.
Figure 1: Diode reverse-biased with a microammeter in series and a voltmeter across the diode.
| S. No. | Reverse Voltage, Vr (V) | Reverse Current, Ir (µA) |
|---|---|---|
| 1 | 0 | 0.00 |
| 2 | 1 | 0.50 |
| 3 | 2 | 0.80 |
| 4 | 4 | 1.10 |
| 5 | 6 | 1.25 |
| 6 | 8 | 1.32 |
| 7 | 10 | 1.40 |
Figure 2: Reverse V-I characteristic showing a nearly flat, saturated leakage current across the tested voltage range.
Continue exploring semiconductor devices with the following experiment:
← V-I Characteristics of PN Junction Diode in Forward Bias Mode